Precision Light Scatter Data for
Faster, More Cost-Effective Optical Product Development

What is an optical scattering measurement?

An optical scattering measurement characterizes how light is reflected or transmitted from any surface or material. It quantifies the amount of light propagated from a surface or material depending on the angle of incidence, wavelenghts, polarization and observation angle.

CODE V Built-In Intelligence Saves Time | Synopsys
CODE V Built-In Intelligence Saves Time | Synopsys

Why you should use optical scattering measurements in your project

Optical scattering measurements are useful for many aspects of optical design:

  • For R&D: Compare the scattering behavior of various surface and material type to make the best choice for your project.
  • For quality control: Use scattering measurements to help diagnose defects in your manufacturing process that originate from elements in the optical system such as imperfections in optical surfaces or light reflections off mechanical elements.
  • For optical simulation: Obtain real-world scattering data to include in optical system digital twins to help manage performance, production and costs.
SmartStart LIbrary for LucidShape | Synopsys

SmartStart Libraries

LightTools and LucidShape products offer SmartStart Libraries of materials and media commonly used in the design of optical systems to help our customers save time and reduce development costs. We continuously augment our SmartStart Libraries to expand customer access to precision light scattering data for faster, physics-based system modeling.


SmartStart Measurement Services

Need custom scattering measurements? Our in-house laboratory is light- and temperature-controlled to provide an optimal measurement environment. Our optical experts provide the following SmartStart Measurement Services:

  • 2D and 3D BSDF (front and back) measurements
  • High-resolution BSDF
  • Spectral BSDF
  • Total Internal Reflectivity (TIR) measurements
  • Total Integrated Scatter (TIS) measurements
  • UV, Visible, and IR wavelengths (from 280 nm to 10.6 microns)

High Specular Bench for Optical Scattering Measurements - Services | Synopsys

High Specular Bench for Optical Measurements - Services | Synopsys


Synopsys High Specular Bench

Our Synopsys high specular bench is well suited for backward and forward light scatter characterization for all types of materials and objects. The system measures BRDF and BTDF, which perfectly represents the way any surface scatters incoming light in 2D space.

Co-developed with the Center for National Scientific Research (CNRS), the high specular bench has been extended into the infrared wavelengths (3.39 and 10.6 µm). We can now provide scatter measurements from the ultraviolet wavelength of 280 nm to the infrared wavelength of 10.6 µm with a dynamic range of 1013.

The high specular bench is 10 meters long, giving it a minimum resolution of 0.02° from the specular direction.

This system is for measurement services only and is not part of our equipment offerings.


Synopsys TIS Pro

Synopsys TIS Pro is an optical scattering instrument for efficient measurements of reflectance, transmittance and absorption. This fully automated device features an integrated sphere and a spectral detector assembled in a housing that controls stray light to ensure fast, accurate measurement results.

Synopsys TIS Pro determines the optical properties of surfaces and materials and provides measurements over the entire visible spectrum at various angles of incidence.


Synopsys Mini-Diff V2

Synopsys Mini-Diff V2 is a compact, portable solution for optical scattering characterization. You can measure the BRDF and BTDF of any kind of material and object. Synopsys Mini-Diff V2 accurately captures measured surface characteristics, including roughness, defects, coatings, and paint.

Synopsys Mini-Diff V2 is delivered with its own suitcase, which includes calibration standards, software, and cables.


Synopsys Mini-Diff VPro

Synopsys Mini-Diff VPro is a camera-based 3D hemispherical scattering measurement solution. Like the Synopsys Mini-Diff V2, the Synopsys Mini-Diff VPro provides BRDF, BTDF, and TIS measurements. It delivers color, reflectance, and transmittance data.

The Synopsys Mini-Diff VPro is integrated in a single box, which controls stray light and temperature deviation during measurements, and provides a high level of stability and precision. The instrument offers a choice of incident angle on the sample from 0 ° to 60°, motorized and controlled from the Synopsys Mini-Diff software.


Synopsys REFLET 180S

The Synopsys REFLET 180S optical bench is easy to use for spot inspection or quick analysis. Synopsys REFLET 180S is especially suited for backward and forward light scatter characterization for all types of materials and objects. It allows you to measure the light distribution contained in the radiation lobe of these materials in photometric and colorimetric terms. Moreover, the system measures BRDF and BTDF, which perfectly represents the way any surface scatters incoming light in 3D space.

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Equipment Specification Chart

 Mini-Diff V2Mini-Diff VProREFLET 180SHigh Specular
Wavelength Light Source465 - 525 - 630 nm - 850 nm and 940 nm 465 nm, 525 nm and 630 nm Halogen white lamp + passband filter Discrete values from 280 nm to 10.6 µm
Wavelength Detector SensitivityNANA Visible
Infrared 900-1700 nm
Optional Spectrometer [400-800] nm
Angles of Incidence Fixed for BRDF and BTDF: 0°, 20°, 40° and 60° Tunable:
For BRDF and BTDF: from 0° to +60°
For BRDF and BTDF: from 0° to +90°
For BRDF: from 5° to +90°
For BTDF: From 0° to +90°
Angular Range3D spherical measurement3D spherical measurement2D and 3D spherical measurement2D spherical measurement
Spot Size (diameter) > 1 mm > 1 mm 1 mm to 13 mm continuous 2 mm to 14 mm depending on wavelengths
Observed Area Size ∅ 1 mm ∅ 1 mm ∅ 6 mm /∅ 8 mm /∅ 14 mm NA
Beam DivergenceNANA+/- 2.26° to +/- 0.15° +/- 0.01° for visible +/-0.1° for infrared
Incident Beam Positioning PrecisionNANA0.001° +/- 0.001°
Detector Acceptance Angle +/- 0.5° +/- 0.5° +/- 0.04° / 1.1° / 2°+/- 0.001°
Detector Positioning PrecisionNANA0.001°NA
Measurement Resolution0.01°/0.1°/1°/10°0.001°
Global Axes Alignment < 0.5°0.002°
Accuracy< 5%< 2%< 1%< 1%
Repeatability< 2%< 2%< 1%< 1%
Minimum BRDF10e-210e-3< 10e-4 < 10e-7 (10e-5 for infrared)
Dynamic Range10e510e6 for BTDF
10e5 for BRDF
10e9 for visible and 10e6 for infrared 10e13 for visible and 10e9 for infrared
Minimum Signature +/- 1° for BTDF at 0° at 525 nm +/- 0.5° for BTDF at 0° at 525 nm +/- 0.15° +/- 0.01° for visible and +/- 0.1° for infrared
Weight 2 kg 42 kg 80 kgNA
Dimensions10 x 10 x 30 cm 450 mm x 600 mm x 738 mm86 x 98 x 122 cmNA
Advantages Plug and play
Easy to use and fast
Portable and compact
High precision
High stability
Easy-to-use instrument
Laboratory version of the Mini-Diff V2
High dynamic range
High precision
High repeatability
Customizable wavelength range
Very high dynamic range
Measurement at 0.02° from the specular
High precision
High repeatability
Customizable wavelength range

Our Scattering Measurement Instruments Are Used by Industry-Leading Companies

  • Automotive Lighting
  • Bayer
  • Bosch
  • Broadcom
  • CREE
  • ESA

  • Nikon
  • Osram
  • Philips
  • Thales
  • Sordern
  • Visteon

Support and integration into your optical software

Our customer success team is anchored by experienced engineers who are optical scattering experts. If you ever need help, our team is available. We also provide an extensive library of on-demand learning resources, including videos, documentation, tutorials and example models.

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